Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower’ this array of spring loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents or just about any connection characteristic you require. inTEST provides electrical interfaces in a wide variety of OEM supported designs, inTEST standards and custom configurations.
Centaur™ PPR
The Centaur Probe Pin Ring (PPR) is inTEST’s unique modular interface. The Centaur interface is an OEM offering on the Xcerra LTX-Credence X-series test systems and is widely used on the Eagle Test Systems ETS364/ETS600 testers and many other mixed signal semiconductor test systems. The Centaur is available in several different array sizes using the basic 160 probe module. The module layout combines high connection density with probe spacing that makes PCB layout quite easy. Probes are individually assignable on the PCBs and can be arranged for controlled impedance, low leakage or low inductance power paths. The long travel, robust probes can handle 5 Amps continuous current. This PPR has over 20 design variations. To ask about the one that's right for your test system, contact us at EMSsales@intest.com.
inFLEX™ PPR
inFlex is inTEST’s solution for the Teradyne Flex family of semiconductor test systems. Mechanically and electrically compatible with the OEM offering the inFLEX series offers true modular construction. Each module has internal guide shims that keep the probes in alignment even when the outer cap is removed. This greatly speeds changing a damaged or contaminated probe. And changing probes can be done with the interface mounted on the prober. Probe Pin Rings (PPRs) are available in the 300mm probe card size with both standard and increased applications space frame. For 440mm applications both the standard and “J” type frames are available with up to 6,400 probes.
inFlex has over 20 designs for test systems. We have one for your test system. Contact us at EMSsales@intest.com.
12” General Purpose PPR
First appearing on the Teradyne J750 semiconductor test platform the 12” general purpose Probe Pin Ring (PPR) is one of the most commonly used interfaces in the semiconductor industry. Originally offering up to 2,992 pins in 8 segments, inTEST introduced the ‘High Pin Count’ version with 5,848 probes in 2008. The increased probe count and many variations of the mounting frame have made this series the industry favorite for a low cost, multiple die probe interface. These inTEST PPRs feature integral cam ramps for a manual test adapter and purge airline inlets.
This PPR has over 35 designs for a multitude of test systems. Contact us for the one that fits your needs. Contact us at EMSsales@intest.com.
OEM PPRs
inTEST offers both licensed and plug compatible versions of many OEM prober interfaces. Great care is taken throughout the design, simulation and testing stages to insure these interfaces can be used interchangeably on your test floor.
Contact EMSsales@intest.com to discuss the available options or use Application.
Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower’ this array of spring loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents or just about any connection characteristic you require. inTEST provides electrical interfaces in a wide variety of OEM supported designs, inTEST standards and custom configurations.
Centaur™ PPR
The Centaur Probe Pin Ring (PPR) is inTEST’s unique modular interface. The Centaur interface is an OEM offering on the Xcerra LTX-Credence X-series test systems and is widely used on the Eagle Test Systems ETS364/ETS600 testers and many other mixed signal semiconductor test systems. The Centaur is available in several different array sizes using the basic 160 probe module. The module layout combines high connection density with probe spacing that makes PCB layout quite easy. Probes are individually assignable on the PCBs and can be arranged for controlled impedance, low leakage or low inductance power paths. The long travel, robust probes can handle 5 Amps continuous current. This PPR has over 20 design variations. To ask about the one that's right for your test system, contact us at EMSsales@intest.com.
inFLEX™ PPR
inFlex is inTEST’s solution for the Teradyne Flex family of semiconductor test systems. Mechanically and electrically compatible with the OEM offering the inFLEX series offers true modular construction. Each module has internal guide shims that keep the probes in alignment even when the outer cap is removed. This greatly speeds changing a damaged or contaminated probe. And changing probes can be done with the interface mounted on the prober. Probe Pin Rings (PPRs) are available in the 300mm probe card size with both standard and increased applications space frame. For 440mm applications both the standard and “J” type frames are available with up to 6,400 probes.
inFlex has over 20 designs for test systems. We have one for your test system. Contact us at EMSsales@intest.com.
12” General Purpose PPR
First appearing on the Teradyne J750 semiconductor test platform the 12” general purpose Probe Pin Ring (PPR) is one of the most commonly used interfaces in the semiconductor industry. Originally offering up to 2,992 pins in 8 segments, inTEST introduced the ‘High Pin Count’ version with 5,848 probes in 2008. The increased probe count and many variations of the mounting frame have made this series the industry favorite for a low cost, multiple die probe interface. These inTEST PPRs feature integral cam ramps for a manual test adapter and purge airline inlets.
This PPR has over 35 designs for a multitude of test systems. Contact us for the one that fits your needs. Contact us at EMSsales@intest.com.
OEM PPRs
inTEST offers both licensed and plug compatible versions of many OEM prober interfaces. Great care is taken throughout the design, simulation and testing stages to insure these interfaces can be used interchangeably on your test floor.
Contact EMSsales@intest.com to discuss the available options or use Application.